Special Issue “UHF and RF Sensor Technology for Partial Discharge Detection”

Special Issue Information

 

Dear Colleagues,

Condition monitoring (CM) of high-voltage (HV) insulation systems is essential for establishing a correct diagnosis regarding the health of these costly and safety-critical industrial assets, as well as for implementing practical condition-based-maintenance (CBM) regimes. The assets being monitored may include rotating machines, power transformers, HV cables and accessories, air-insulated-substations (AIS), gas-insulated-switchgear (GIS) and overhead lines. Recent advances have seen widespread development of non-contact electromagnetic wave sensors for detecting and locating partial discharges and electrical arcs. These sensors play an important role in periodic testing, continuous monitoring or ‘fingerprinting’ of RF emissions from HV equipment. Practical applications of UHF and other RF techniques are leading to the development of new sensors and associated solutions for signal acquisition, processing, analysis and interpretation, which in turn require new approaches to decision making about the condition of assets being monitored.

The aim of this Special Issue is to report on recent advances relating to the following themes: (1) non-contact electromagnetic sensors (RF, UHF, near field, electric, magnetic, etc.) used for detecting signals emitted by insulation defects either internally, or external to the equipment in question; (2) practical methods for integrating these sensors into real equipment for use in condition monitoring; (3) case studies and examples of implementation of the techniques in an industrial or laboratory setting; (4) sensor models to support the design process or for predicting their response (using data-driven modeling approaches, for example); and (5) bridging the gap between condition monitoring research and subsequent decision making using these technologies, possibly in combination with other monitoring parameters.

Prof. Dr. Ricardo Albarracín
Prof. Dr. Martin D. Judd
Prof. Dr. Guillermo Robles
Prof. Dr. Pavlos Lazaridis
Guest Editors

Manuscript Submission Information

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